An embodiment of a method for manufacturing an electronic device realized on a semiconductor substrate and protected against electro static discharge by the provision of supporting means for the electronic device to keep it far from contacts with possible sources of an ESD event during the manufacturing phases. The supporting means are associated with said electronic device in all the manufacturing stages for instance when assembling the device, when picking and placing it in trays a first time, during the burning-in testing phases, when picking and placing it in trays a second time, or when picking and placing it in a scanner. In an embodiment, the supporting means are protective notches associated with the back side of the semiconductor substrate and provided at each edge corner of the semiconductor substrate.