Invention Grant
- Patent Title: Magnetic field measuring device
- Patent Title (中): 磁场测量装置
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Application No.: US13108096Application Date: 2011-05-16
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Publication No.: US08742751B2Publication Date: 2014-06-03
- Inventor: Yan Liang , Qian-Long Liao
- Applicant: Yan Liang , Qian-Long Liao
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Fu Tai Hua Industry (Shenzhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Fu Tai Hua Industry (Shenzhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN201010598604 20101221
- Main IPC: G01B7/30
- IPC: G01B7/30 ; G01D5/14 ; G01B3/00

Abstract:
A magnetic field measuring device includes a support base, a measuring mechanism, and a displacement sensor. The measuring mechanism is positioned on the support base, and includes a mounting plate, a swing arm, a connecting member, an elastic member, and a measuring magnet. The mounting plate is connected to the support base. The swing arm is rotatably positioned on the mounting plate. The elastic member is positioned between the connecting member and the swing arm. The measuring magnet is connected to the swing arm, opposite to the support base. The displacement sensor is positioned on the support base, opposite to the swing arm.
Public/Granted literature
- US20120153939A1 MAGNETIC FIELD MEASURING DEVICE Public/Granted day:2012-06-21
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