Invention Grant
- Patent Title: Interrogation measurement system and method providing accurate permittivity measurements via ultra-wideband removal of spurious reflectors
- Patent Title (中): 询问测量系统和方法通过超宽带去除寄生反射器提供准确的介电常数测量
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Application No.: US13214576Application Date: 2011-08-22
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Publication No.: US08742768B1Publication Date: 2014-06-03
- Inventor: Mathew G. Pelletier , Joseph A. Viera, Jr. , Gregory A. Holt , John D. Wanjura
- Applicant: Mathew G. Pelletier , Joseph A. Viera, Jr. , Gregory A. Holt , John D. Wanjura
- Applicant Address: US DC Washington US VA Alexandria
- Assignee: The United States of America as represented by the Secretary of Agriculture,Microsemi Corporation
- Current Assignee: The United States of America as represented by the Secretary of Agriculture,Microsemi Corporation
- Current Assignee Address: US DC Washington US VA Alexandria
- Agent John Fado; Randall E. Deck; Albert Y. Tsui
- Main IPC: G01R31/3193
- IPC: G01R31/3193

Abstract:
A method and apparatus for determining at least one property of a target material is disclosed. The method is constituted of: providing a time varying signal at comprising frequency content over a range of frequencies; transducing the provided signal so as to interact with the target material; receiving the provided time varying signal after interaction with the target material; mixing the received time varying signal with a portion of the provided time varying signal; determining the propagation delay associated with the target material of the received provided time varying signal at each of a plurality of frequencies within the range of frequencies; and determining at least one property of the target material responsive to the determined propagation delay at each of the plurality of frequencies.
Information query
IPC分类: