Invention Grant
US08742780B2 Semiconductor devices including design for test capabilities and semiconductor modules and test systems including such devices
有权
半导体器件包括测试能力设计和半导体模块以及测试系统，包括这些器件
- Patent Title: Semiconductor devices including design for test capabilities and semiconductor modules and test systems including such devices
- Patent Title (中): 半导体器件包括测试能力设计和半导体模块以及测试系统，包括这些器件
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Application No.: US12915314Application Date: 2010-10-29
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Publication No.: US08742780B2Publication Date: 2014-06-03
- Inventor: Seok-Il Kim , Ho-Suk Lee , You-Keun Han , Yang-Ki Kim
- Applicant: Seok-Il Kim , Ho-Suk Lee , You-Keun Han , Yang-Ki Kim
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel Sibley & Sajovec, PA
- Priority: KR10-2009-0111225 20091118
- Main IPC: G01R31/3187
- IPC: G01R31/3187 ; G01R31/317 ; G01R31/3185 ; G01R31/28 ; G01R31/30 ; H01L21/66
Abstract:
A semiconductor device includes a resistor terminal, a reference voltage generator and a detector. The resistor terminal is connected to an external resistor. The reference voltage generator generates at least one reference voltage. The detector generates a detection signal based at least in part on a resistor terminal voltage and the at least one reference voltage. The detection signal indicates a state of an electrical connection to the resistor terminal. The resistor terminal voltage is a voltage at the resistor terminal.
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