Invention Grant
- Patent Title: Semiconductor device and operation monitoring method for semiconductor device
- Patent Title (中): 半导体器件的半导体器件和操作监控方法
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Application No.: US12410157Application Date: 2009-03-24
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Publication No.: US08742786B2Publication Date: 2014-06-03
- Inventor: Kazufumi Komura , Katsumi Furukawa , Keiichi Fujimura , Takayoshi Nakamura , Tohru Yasuda , Hirohisa Nishiyama , Nobuyoshi Nakaya , Kanta Yamamoto , Shigetaka Asano
- Applicant: Kazufumi Komura , Katsumi Furukawa , Keiichi Fujimura , Takayoshi Nakamura , Tohru Yasuda , Hirohisa Nishiyama , Nobuyoshi Nakaya , Kanta Yamamoto , Shigetaka Asano
- Applicant Address: JP Yokohama
- Assignee: Fujitsu Semiconductor Limited
- Current Assignee: Fujitsu Semiconductor Limited
- Current Assignee Address: JP Yokohama
- Agency: Arent Fox LLP
- Priority: JP2008-92752 20080331
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
A semiconductor device includes a monitor including a first element coupled between a first power supply line and a second power supply line, and a load for increasing a load value between the first element and the first power supply line or the second power supply line, and a determination unit which determines an operating state of the first element based on an output of the monitor.
Public/Granted literature
- US20090243627A1 SEMICONDUCTOR DEVICE AND OPERATION MONITORING METHOD FOR SEMICONDUCTOR DEVICE Public/Granted day:2009-10-01
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