Invention Grant
US08743249B2 Solid state imaging device and camera system having test-pattern generating circuitry
有权
具有测试图形生成电路的固态成像装置和相机系统
- Patent Title: Solid state imaging device and camera system having test-pattern generating circuitry
- Patent Title (中): 具有测试图形生成电路的固态成像装置和相机系统
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Application No.: US13282234Application Date: 2011-10-26
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Publication No.: US08743249B2Publication Date: 2014-06-03
- Inventor: Tadayuki Taura
- Applicant: Tadayuki Taura
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: The Chicago Technology Law Group, LLC
- Agent Robert J. Depke
- Priority: JP2007-109665 20070418
- Main IPC: H04N3/14
- IPC: H04N3/14 ; H04N5/335 ; H04N17/00

Abstract:
A data transfer circuit includes at least one data transfer line that transfers digital data, at least one data detecting circuit connected to the transfer line, holding circuits that hold digital values corresponding to input levels and that transfer the digital values to the transfer line, a scanning circuit that selects a holding circuit, at least one test-pattern generating circuit that generates a digital value, the test-pattern generating circuit connected to the transfer line, at least one test-column scanning circuit that selects the test-pattern generating circuit, and a start-pulse selecting circuit that controls starting of the scanning circuit and the test-column scanning circuit. The start-pulse selecting circuit transfers a digital value to the data transfer line by activating the test-pattern generating circuit.
Public/Granted literature
- US20120053882A1 DATA TRANSFER CIRCUIT, SOLID-STATE IMAGING DEVICE, AND CAMERA SYSTEM Public/Granted day:2012-03-01
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