Invention Grant
- Patent Title: Optical measurement apparatus and optical measurement system
- Patent Title (中): 光学测量仪器和光学测量系统
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Application No.: US13460209Application Date: 2012-04-30
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Publication No.: US08743362B2Publication Date: 2014-06-03
- Inventor: Kazuhiro Gono
- Applicant: Kazuhiro Gono
- Applicant Address: JP Tokyo
- Assignee: Olympus Medical Systems Corp.
- Current Assignee: Olympus Medical Systems Corp.
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Main IPC: G01J3/46
- IPC: G01J3/46 ; A61B1/00 ; A61B5/00

Abstract:
An optical measurement apparatus, to which a base end portion of a measurement probe introduced into a subject is connected so that scattering light from the subject through the measurement probe can be measured, includes: calibration member serving as an irradiation target of illumination light when a calibration process is performed for the measurement probe using the illumination light from the measurement probe; an insertion portion where a leading end of the measurement probe can be inserted; a housing portion that communicates with the insertion portion and accommodates the calibration member movably along a penetration direction of the insertion portion; a detection unit that detects insertion of the measurement probe when the calibration member reaches a predetermined position in the housing portion by the insertion of the measurement probe through the insertion portion; and a control unit that performs control for initiating the calibration process when the detection unit detects the insertion of the measurement probe.
Public/Granted literature
- US20130016351A1 OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT SYSTEM Public/Granted day:2013-01-17
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