Invention Grant
US08743374B2 Shape measuring device, shape measuring method, and shape measuring program
有权
形状测量装置,形状测量方法和形状测量程序
- Patent Title: Shape measuring device, shape measuring method, and shape measuring program
- Patent Title (中): 形状测量装置,形状测量方法和形状测量程序
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Application No.: US13957522Application Date: 2013-08-02
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Publication No.: US08743374B2Publication Date: 2014-06-03
- Inventor: Takashi Nakatsukasa
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: Keyence Corporation
- Current Assignee: Keyence Corporation
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: JP2012-199983 20120911
- Main IPC: G01B11/24
- IPC: G01B11/24

Abstract:
The invention provide a shape measuring device, a shape measuring method, and a shape measuring program capable of clearly observing a surface state of a measuring object while measuring a shape of the measuring object at high accuracy. Light irradiated by a light projecting unit is reflected by a measuring object and received by a light receiving unit. Stereoscopic shape data of the measuring object is generated by a triangular distance measuring method. The light irradiated by the light projecting unit is reflected by the measuring object and received by the light receiving unit. All-focus texture image data of the measuring object is generated by synthesizing texture image data of a plurality of portions of the measuring object while changing a focus position of the light receiving unit. The stereoscopic shape data and the all-focus texture image data are synthesized to generate synthesized data.
Public/Granted literature
- US20140071458A1 Shape Measuring Device, Shape Measuring Method, And Shape Measuring Program Public/Granted day:2014-03-13
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