Invention Grant
- Patent Title: Memory devices having break cells
- Patent Title (中): 具有断裂电池的存储器件
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Application No.: US13765704Application Date: 2013-02-13
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Publication No.: US08743581B2Publication Date: 2014-06-03
- Inventor: Yukit Tang , Kuoyuan Hsu , Derek Tao
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Duane Morris LLP
- Main IPC: G11C15/02
- IPC: G11C15/02 ; G11C11/00

Abstract:
A representative memory device includes a cell array, at least one break cell that subdivides the cell array into bit cell arrays, and one or more power switches that are electrically coupled to the bit cell. In one embodiment, the break cell separates a connectivity of a first voltage and a second voltage between at least two bit cell arrays so that the bit cell arrays can be selectively coupled to either the first voltage or the second voltage using the power switches. The power switches control the connection of each separated bit cell array of the cell array to either the first voltage or second voltage.
Public/Granted literature
- US20130155751A1 MEMORY DEVICES HAVING BREAK CELLS Public/Granted day:2013-06-20
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