Invention Grant
- Patent Title: Nonvolatile memory devices having improved read reliability
- Patent Title (中): 具有改善的读取可靠性的非易失性存储器件
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Application No.: US13009979Application Date: 2011-01-20
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Publication No.: US08743604B2Publication Date: 2014-06-03
- Inventor: Donghyuk Chae
- Applicant: Donghyuk Chae
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Stanzione & Kim, LLP
- Priority: KR10-2010-0011553 20100208
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
Memory systems include at least one nonvolatile memory array having a plurality of rows of nonvolatile multi-bit (e.g., N-bit, where N>2) memory cells therein. A control circuit is also provided, which is electrically coupled to the nonvolatile memory array. The control circuit is configured to program at least two pages of data into a first row of nonvolatile multi-bit memory cells in the nonvolatile memory array using a first sequence of read voltages to verify accuracy of the data stored within the first row. The control circuit is also configured to read the at least two pages of data from the first row using a second sequence of read voltages that is different from the first sequence of read voltages. Each of the read voltages in the first sequence of read voltages may be equivalent in magnitude to a corresponding read voltage in the second sequence of read voltages.
Public/Granted literature
- US20110194347A1 Nonvolatile Memory Devices Having Improved Read Reliability Public/Granted day:2011-08-11
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