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US08743638B2 Method and circuit for testing a multi-chip package 有权
用于测试多芯片封装的方法和电路

Method and circuit for testing a multi-chip package
Abstract:
A method and circuit for testing a multi-chip package is provided. The multi-chip package includes at least a memory chip, and the memory chip includes a number of memory cells. The method includes performing a normal read operation on the memory cells to check if data read from the memory cells is the same with preset data in the memory cells; and performing a special read operation on the memory cells to check if data read from the memory cells is the same with an expected value, wherein the expected value is independent from data stored in the memory cells.
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