Invention Grant
- Patent Title: Test apparatus and test method
- Patent Title (中): 试验装置及试验方法
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Application No.: US12962569Application Date: 2010-12-07
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Publication No.: US08743702B2Publication Date: 2014-06-03
- Inventor: Shinichi Ishikawa , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- Applicant: Shinichi Ishikawa , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Main IPC: H04L1/00
- IPC: H04L1/00 ; H04L12/26 ; G01R31/08
Abstract:
Provided is a test apparatus that tests a device under test, comprising: a plurality of channels that output and receive signals to and from the device under test; a generating section that generates a packet data sequence transmitted to and from the device under test; and a channel selecting section that selects which of the channels is used to transmit the packet data sequence generated by the generating section.
Public/Granted literature
- US20110137606A1 TEST APPARATUS AND TEST METHOD Public/Granted day:2011-06-09
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