Invention Grant
- Patent Title: Integrated X-ray source having a multilayer total internal reflection optic device
- Patent Title (中): 具有多层全内反射光学装置的集成X射线源
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Application No.: US12979409Application Date: 2010-12-28
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Publication No.: US08744048B2Publication Date: 2014-06-03
- Inventor: Susanne Madeline Lee , Peter Michael Edic , Forrest Frank Hopkins , Alfried Haase , Eberhard Neuser
- Applicant: Susanne Madeline Lee , Peter Michael Edic , Forrest Frank Hopkins , Alfried Haase , Eberhard Neuser
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Seema S. Katragadda
- Main IPC: H01J35/08
- IPC: H01J35/08 ; H01J35/18 ; G21K1/00 ; G21G4/04

Abstract:
An integrated X-ray source is provided. The integrated X-ray source includes a target for emitting X-rays upon being struck by one or more excitation beams, and one or more total internal reflection multilayer optic devices in physical contact with the target to transmit at least a portion of the X rays through total internal reflection to produce X-ray beams, wherein the optic device comprises an input face for receiving the X rays and an output face through which the X-ray beams exit the integrated X-ray source.
Public/Granted literature
- US20120163547A1 INTEGRATED X-RAY SOURCE HAVING A MULTILAYER TOTAL INTERNAL REFLECTION OPTIC DEVICE Public/Granted day:2012-06-28
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