An apparatus and method are disclosed for providing test mode contact pad reconfigurations that expose individual internal functional modules or block groups in an integrated circuit for testing and for monitoring. A plurality of switches between each functional module switches between passing internal signals among the blocks and passing in/out signals external to the block when one or more contact pads are strapped to input a pre-determined value. Another set of switches between the functional modules and input/output contact pads switch between functional inputs to and from the functional modules and monitored signals or input/output test signals according to the selected mode of operation.