Invention Grant
- Patent Title: Load card for testing peripheral component interconnect slots
- Patent Title (中): 加载卡用于测试外围组件互连插槽
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Application No.: US13337063Application Date: 2011-12-24
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Publication No.: US08745297B2Publication Date: 2014-06-03
- Inventor: Chao-Ke Wei , Bo Tian , Ze-Yun Wu
- Applicant: Chao-Ke Wei , Bo Tian , Ze-Yun Wu
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN201110325632 20111024
- Main IPC: H05K7/10
- IPC: H05K7/10
Abstract:
A load card for testing different types of PCI slots is provided. The load card includes several gold fingers, and resistor selection circuits. Each gold finger corresponds to one PCI slot. Each resistor selection circuit includes a resistor to test at least one PCI slot working in one working voltage. When a PCI slot working at a working voltage is to be tested, the gold finger connects to the PCI slot, and the resistor selection circuit including the resistor to test the PCI slot working at the working voltage is enabled and others are disabled in response to an operation of the user.
Public/Granted literature
- US20130103879A1 LOAD CARD FOR TESTING PERIPHERAL COMPONENT INTERCONNECT SLOTS Public/Granted day:2013-04-25
Information query
