Invention Grant
US08745447B2 System and method for analyzing an electronics device including a logic analyzer
有权
用于分析包括逻辑分析仪的电子设备的系统和方法
- Patent Title: System and method for analyzing an electronics device including a logic analyzer
- Patent Title (中): 用于分析包括逻辑分析仪的电子设备的系统和方法
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Application No.: US12983016Application Date: 2010-12-31
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Publication No.: US08745447B2Publication Date: 2014-06-03
- Inventor: James Ray Bailey , Christopher W. Case , Michael Anthony Marra, III
- Applicant: James Ray Bailey , Christopher W. Case , Michael Anthony Marra, III
- Applicant Address: US KY Lexington
- Assignee: Lexmark International, Inc.
- Current Assignee: Lexmark International, Inc.
- Current Assignee Address: US KY Lexington
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A system for testing or debugging a system including the integrated circuit having an embedded logic analyzer. In one embodiment, the system includes a computing device coupled to the logic analyzer for receiving the at least one output. A user interface run on the computing device assigns an attribute to at least one signal associated with the logic analyzer, determines a new signal or value not provided by the logic analyzer, the new signal or value being based upon the at least one signal as received from the logic analyzer and upon a predetermined definition, and presents the new signal or value to a system user.
Public/Granted literature
- US20110167311A1 System and Method for Analyzing an Electronics Device Including a Logic Analyzer Public/Granted day:2011-07-07
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