Invention Grant
US08745453B1 Circuits, architectures, apparatuses, systems, methods, algorithms, software and firmware for using reserved cells to indicate defect positions
有权
用于使用保留单元来指示缺陷位置的电路，架构，设备，系统，方法，算法，软件和固件
- Patent Title: Circuits, architectures, apparatuses, systems, methods, algorithms, software and firmware for using reserved cells to indicate defect positions
- Patent Title (中): 用于使用保留单元来指示缺陷位置的电路，架构，设备，系统，方法，算法，软件和固件
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Application No.: US13947836Application Date: 2013-07-22
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Publication No.: US08745453B1Publication Date: 2014-06-03
- Inventor: Pantas Sutardja , Zining Wu
- Applicant: Marvell International Ltd.
- Applicant Address: BM Hamilton
- Assignee: Marvell International Ltd.
- Current Assignee: Marvell International Ltd.
- Current Assignee Address: BM Hamilton
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C7/00 ; H03M13/00 ; G11C29/02 ; G11C29/04 ; G11C29/44 ; G11C29/50 ; G11C29/52 ; G06F11/10
Abstract:
A system including a memory controller configured to identify a first memory cell of a first plurality of memory cells as defective and to store information about the first memory cell in a second memory cell of a second plurality of memory cells. The second plurality of memory cells is configured to store data at a lower density than the first plurality of memory cells. In response to (i) reading data from the first plurality of memory cells and (ii) the first memory cell of the first plurality of memory cells having been identified as defective, the memory controller is configured to read the information about the first memory cell stored in the second memory cell and to determine a location of the first memory cell in the first plurality of memory cells.
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