Invention Grant
US08745567B1 Efficient apparatus and method for analysis of RTL structures that cause physical congestion
有权
用于分析导致物理拥塞的RTL结构的有效装置和方法
- Patent Title: Efficient apparatus and method for analysis of RTL structures that cause physical congestion
- Patent Title (中): 用于分析导致物理拥塞的RTL结构的有效装置和方法
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Application No.: US13952024Application Date: 2013-07-26
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Publication No.: US08745567B1Publication Date: 2014-06-03
- Inventor: Ravi Varadrajan , Jitendra Gupta , Priyank Mittal , Tapeesh Gupta , Navneet Mohindru
- Applicant: Atrenta, Inc.
- Applicant Address: US CA San Jose
- Assignee: Atrenta, Inc.
- Current Assignee: Atrenta, Inc.
- Current Assignee Address: US CA San Jose
- Agent Thomas Schneck; Mark Protsik
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A logical congestion metric analysis engine predicts pre-placement routing congestion of integrated circuit designs. The engine uses a method employing new congestion-predicting metrics derived from structural register transfer level (RTL). The method compares multiple metrics to those stored in a knowledge base to predict routing congestion. The knowledge base contains routing results for multiple designs using the same technology. For each design the knowledge base holds pre-placement metric values and the corresponding post-placement and routing congestion results. A logical congestion debug tool allows users to visualize and fix congestion issues.
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