Invention Grant
- Patent Title: Thermoanalytical instrument
- Patent Title (中): 热分析仪器
-
Application No.: US12466068Application Date: 2009-05-14
-
Publication No.: US08746966B2Publication Date: 2014-06-10
- Inventor: Ernst Van De Kerkhof , Paul Pieter Willem Van Grinsven
- Applicant: Ernst Van De Kerkhof , Paul Pieter Willem Van Grinsven
- Applicant Address: CH Greifensee
- Assignee: Mettler-Toledo AG
- Current Assignee: Mettler-Toledo AG
- Current Assignee Address: CH Greifensee
- Agency: Standley Law Group LLP
- Priority: EP08158196 20080613
- Main IPC: G01K17/00
- IPC: G01K17/00 ; G01N25/20

Abstract:
A thermoanalytical instrument, and especially a differential scanning calorimeter, has first and second measurement positions, a heater and a temperature sensor associated with each of the measurement positions, and a controller. The controller, which has an associated means for setting a predetermined temperature program, controls a heating power of the first heater to cause the temperature measured at the first position to follow the temperature program. The controller also controls both heaters to eliminate any temperature difference between the measured first and second temperatures. The controller also provides a means for determining the lower of the measured first and second measured temperatures and applies additional power to the heater associated with that lower measured temperature.
Public/Granted literature
- US20090310644A1 THERMOANALYTICAL INSTRUMENT Public/Granted day:2009-12-17
Information query