Invention Grant
- Patent Title: Solution for removal of residue after semiconductor dry process and residue removal method using same
- Patent Title (中): 半导体干法除渣后的残渣除渣方法
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Application No.: US13059204Application Date: 2009-08-04
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Publication No.: US08747564B2Publication Date: 2014-06-10
- Inventor: Shingo Nakamura
- Applicant: Shingo Nakamura
- Applicant Address: JP Osaka
- Assignee: Daikin Industries, Ltd.
- Current Assignee: Daikin Industries, Ltd.
- Current Assignee Address: JP Osaka
- Agency: Sughrue Mion, PLLC
- Priority: JP2008-214844 20080825
- International Application: PCT/JP2009/063774 WO 20090804
- International Announcement: WO2010/024093 WO 20100304
- Main IPC: B08B3/04
- IPC: B08B3/04 ; C11D3/30

Abstract:
A residue-removing solution for removing residues after a dry process, which includes an amine salt of a monocarboxylic acid and/or a salt of a polycarboxylic acid that forms a 7- or more-membered ring chelate with copper, and water, the residue-removing solution containing aqueous solution (A) or (B) as described herein. Also disclosed is a method for removing residues present on a semiconductor substrate after dry etching and/or ashing. Further, a method for manufacturing semiconductor devices is further disclosed, which includes subjecting a semiconductor substrate having Cu as an interconnect material, and a low dielectric constant film as an interlayer dielectric material, to dry etching and/or ashing; and bringing the processed semiconductor substrate into contact with the above residue-removing solution.
Public/Granted literature
- US20110143547A1 SOLUTION FOR REMOVAL OF RESIDUE AFTER SEMICONDUCTOR DRY PROCESS AND RESIDUE REMOVAL METHOD USING SAME Public/Granted day:2011-06-16
Information query
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