Invention Grant

  • Patent Title: Solution for removal of residue after semiconductor dry process and residue removal method using same
  • Patent Title (中): 半导体干法除渣后的残渣除渣方法
  • Application No.: US13059204
    Application Date: 2009-08-04
  • Publication No.: US08747564B2
    Publication Date: 2014-06-10
  • Inventor: Shingo Nakamura
  • Applicant: Shingo Nakamura
  • Applicant Address: JP Osaka
  • Assignee: Daikin Industries, Ltd.
  • Current Assignee: Daikin Industries, Ltd.
  • Current Assignee Address: JP Osaka
  • Agency: Sughrue Mion, PLLC
  • Priority: JP2008-214844 20080825
  • International Application: PCT/JP2009/063774 WO 20090804
  • International Announcement: WO2010/024093 WO 20100304
  • Main IPC: B08B3/04
  • IPC: B08B3/04 C11D3/30
Solution for removal of residue after semiconductor dry process and residue removal method using same
Abstract:
A residue-removing solution for removing residues after a dry process, which includes an amine salt of a monocarboxylic acid and/or a salt of a polycarboxylic acid that forms a 7- or more-membered ring chelate with copper, and water, the residue-removing solution containing aqueous solution (A) or (B) as described herein. Also disclosed is a method for removing residues present on a semiconductor substrate after dry etching and/or ashing. Further, a method for manufacturing semiconductor devices is further disclosed, which includes subjecting a semiconductor substrate having Cu as an interconnect material, and a low dielectric constant film as an interlayer dielectric material, to dry etching and/or ashing; and bringing the processed semiconductor substrate into contact with the above residue-removing solution.
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