Invention Grant
- Patent Title: Grinding/electrolysis combined multi-wire-slicing processing method for silicon wafers
- Patent Title (中): 硅片的研磨/电解组合多线切片加工方法
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Application No.: US13639847Application Date: 2010-07-14
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Publication No.: US08747625B2Publication Date: 2014-06-10
- Inventor: Wei Wang , Zhengxun Liu
- Applicant: Wei Wang , Zhengxun Liu
- Applicant Address: CN
- Assignee: Nanjing University of Aeronautics and Astronautics
- Current Assignee: Nanjing University of Aeronautics and Astronautics
- Current Assignee Address: CN
- Agency: Christie, Parker & Hale, LLP
- Priority: CN201010141727 20100408
- International Application: PCT/CN2010/075147 WO 20100714
- International Announcement: WO2011/124044 WO 20111013
- Main IPC: B23H5/00
- IPC: B23H5/00 ; B23H5/06 ; B23H5/08 ; B23H5/10 ; H01L21/02 ; B23H1/00 ; B23H7/02 ; B23H7/08

Abstract:
A grinding/electrolysis combined multi-wire-slicing processing method for silicon wafers includes the following steps: first, with a metal slicing wire (10) provided on a multi-wire-slicing machine serving as cathode, a silicon rod or a silicon ingot (1) (anode) is processed by grinding/electrolysis combined multi-wire-slicing through application of a voltage; second, during said processing, the metal slicing wire (10) and the silicon rod or a silicon ingot (1) are connected with a low-voltage continuous or pulsed direct current power supply (9); third, an electrolytic liquid is sprayed into the cutting area to ensure cooling and anode erosion. The method reduces macroscopic cutting force and enables a grinding/electrolysis combined multi-wire-slicing processing method for large size ultra-thin silicon wafers.
Public/Granted literature
- US20130075274A1 GRINDING/ELECTROLYSIS COMBINED MULTI-WIRE-SLICING PROCESSING METHOD FOR SILICON WAFERS Public/Granted day:2013-03-28
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