Invention Grant
US08747689B2 Liquid processing method, liquid processing apparatus and storage medium
有权
液体处理方法,液体处理装置和储存介质
- Patent Title: Liquid processing method, liquid processing apparatus and storage medium
- Patent Title (中): 液体处理方法,液体处理装置和储存介质
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Application No.: US13355709Application Date: 2012-01-23
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Publication No.: US08747689B2Publication Date: 2014-06-10
- Inventor: Hiroki Ohno , Takehiko Orii
- Applicant: Hiroki Ohno , Takehiko Orii
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Pearne & Gordon LLP
- Priority: JP2011-013473 20110125
- Main IPC: B44C1/22
- IPC: B44C1/22

Abstract:
There are provided a liquid processing method and a liquid processing apparatus capable of providing a high etching rate and a high etching selectivity for silicon nitride against silicon oxide, and a storage medium storing the method thereon. In the method for etching, by an etching solution, a substrate on which silicon nitride and silicon oxide are exposed, the etching solution is produced by mixing a fluorine ion source material, water and a boiling point adjusting agent; the produced etching solution is heated to a substrate processing temperature equal to or higher than 140° C.; after a temperature of the etching solution reaches the substrate processing temperature, the temperature of the etching solution is maintained at the substrate processing temperature for a first preset time; and after a lapse of the first preset time, the substrate is etched by the etching solution maintained at the substrate processing temperature.
Public/Granted literature
- US20120187088A1 LIQUID PROCESSING METHOD, LIQUID PROCESSING APPARATUS AND STORAGE MEDIUM Public/Granted day:2012-07-26
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