Invention Grant
US08748275B2 Semiconductor devices comprising a channel semiconductor alloy formed with reduced STI topography
有权
半导体器件包括形成有减少的STI形貌的沟道半导体合金
- Patent Title: Semiconductor devices comprising a channel semiconductor alloy formed with reduced STI topography
- Patent Title (中): 半导体器件包括形成有减少的STI形貌的沟道半导体合金
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Application No.: US13191993Application Date: 2011-07-27
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Publication No.: US08748275B2Publication Date: 2014-06-10
- Inventor: Hans-Juergen Thees , Stephan Kronholz , Maciej Wiatr
- Applicant: Hans-Juergen Thees , Stephan Kronholz , Maciej Wiatr
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee Address: KY Grand Cayman
- Agency: Amerson Law Firm, PLLC
- Priority: DE102010063296 20101216
- Main IPC: H01L21/76
- IPC: H01L21/76

Abstract:
In sophisticated semiconductor devices, a semiconductor alloy, such as a threshold adjusting semiconductor material in the form of silicon/germanium, may be provided in an early manufacturing stage selectively in certain active regions, wherein a pronounced degree of recessing and material loss, in particular in isolation regions, may be avoided by providing a protective material layer selectively above the isolation regions. For example, in some illustrative embodiments, a silicon material may be selectively deposited on the isolation regions.
Public/Granted literature
- US20120156846A1 Semiconductor Devices Comprising a Channel Semiconductor Alloy Formed with Reduced STI Topography Public/Granted day:2012-06-21
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