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US08748275B2 Semiconductor devices comprising a channel semiconductor alloy formed with reduced STI topography 有权
半导体器件包括形成有减少的STI形貌的沟道半导体合金

Semiconductor devices comprising a channel semiconductor alloy formed with reduced STI topography
Abstract:
In sophisticated semiconductor devices, a semiconductor alloy, such as a threshold adjusting semiconductor material in the form of silicon/germanium, may be provided in an early manufacturing stage selectively in certain active regions, wherein a pronounced degree of recessing and material loss, in particular in isolation regions, may be avoided by providing a protective material layer selectively above the isolation regions. For example, in some illustrative embodiments, a silicon material may be selectively deposited on the isolation regions.
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