Invention Grant
- Patent Title: MS/MS mass spectrometer
- Patent Title (中): MS / MS质谱仪
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Application No.: US13589989Application Date: 2012-08-20
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Publication No.: US08748811B2Publication Date: 2014-06-10
- Inventor: Daisuke Okumura
- Applicant: Daisuke Okumura
- Applicant Address: JP Kyoto-Shi
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto-Shi
- Agency: Bingham McCutchen LLP
- Main IPC: H01J49/26
- IPC: H01J49/26 ; H01J49/42

Abstract:
A mass analysis of a sample having a known mass-to-charge ratio is carried out by performing a scan at a first-stage quadrupole over a predetermined mass range, under the condition that a collision induced dissociation gas is introduced into a collision cell and a voltage applied to a third-stage quadrupole is set so that no substantial mass separation occurs in this quadrupole. Various product ions originating from a precursor ion selected by the first-stage quadrupole arrive at and are detected by a detector without being mass separated. Accordingly, based on the detection data, a data processor can obtain a relationship between the voltage applied to the first-stage quadrupole and the mass-to-charge ratio of the selected ions, with a time delay in the collision cell reflected in that relationship. This relationship is stored in a calibration data memory, to be utilized in a neutral loss scan measurement or the like.
Public/Granted literature
- US20130214146A1 MS/MS Mass Spectrometer Public/Granted day:2013-08-22
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