Invention Grant
- Patent Title: Transistor and method for manufacturing same
- Patent Title (中): 晶体管及其制造方法
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Application No.: US13567503Application Date: 2012-08-06
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Publication No.: US08748939B2Publication Date: 2014-06-10
- Inventor: Toshiyuki Takizawa , Tetsuzo Ueda
- Applicant: Toshiyuki Takizawa , Tetsuzo Ueda
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2010-070480 20100325
- Main IPC: H01L31/102
- IPC: H01L31/102

Abstract:
The transistor includes an underlying layer 301 formed on a substrate 300, and a first layer (including an operation layer 302) made of a nitride semiconductor formed on the underlying layer 301. The underlying layer 301 is a multilayered structure including a plurality of stacked nitride semiconductor layers. The underlying layer 301 includes a transition-metal-containing layer containing at least one of cobalt, nickel, ruthenium, osmium, rhodium, or iridium which is a transition metal.
Public/Granted literature
- US20120299059A1 TRANSISTOR AND METHOD FOR MANUFACTURING SAME Public/Granted day:2012-11-29
Information query
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