Invention Grant
- Patent Title: Infrared imaging device and method for manufacturing same
- Patent Title (中): 红外成像装置及其制造方法
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Application No.: US13426097Application Date: 2012-03-21
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Publication No.: US08749010B2Publication Date: 2014-06-10
- Inventor: Ikuo Fujiwara , Hitoshi Yagi , Keita Sasaki
- Applicant: Ikuo Fujiwara , Hitoshi Yagi , Keita Sasaki
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: H01L27/146
- IPC: H01L27/146 ; H01L31/058

Abstract:
According to one embodiment, an infrared imaging device includes a substrate, a detecting section, an interconnection, a contact plug and a support beam. The detecting section is provided above the substrate and includes an infrared absorbing section and a thermoelectric converting section. The interconnection is provided on an interconnection region of the substrate and is configured to read the electrical signal. The contact plug is extends from the interconnection toward a connecting layer provided in the interconnection region. The contact plug is electrically connected to the interconnection and the connecting layer. The support beam includes a support beam interconnection and supports the detecting section above the substrate. The support beam interconnection transmits the electrical signal from the thermoelectric converting section to the interconnection.
Public/Granted literature
- US20120175723A1 INFRARED IMAGING DEVICE AND METHOD FOR MANUFACTURING SAME Public/Granted day:2012-07-12
Information query
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