Invention Grant
- Patent Title: Apparatus and method for detecting abnormality of high voltage circuit
- Patent Title (中): 高压电路异常检测装置及方法
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Application No.: US13391718Application Date: 2010-09-09
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Publication No.: US08749247B2Publication Date: 2014-06-10
- Inventor: Yuuichi Hara , Noriko Hoshino , Tsuyoshi Morita
- Applicant: Yuuichi Hara , Noriko Hoshino , Tsuyoshi Morita
- Applicant Address: JP Yokohama-shi
- Assignee: Nissan Motor Co., Ltd.
- Current Assignee: Nissan Motor Co., Ltd.
- Current Assignee Address: JP Yokohama-shi
- Agency: Foley & Lardner LLP
- Priority: JP2009-219037 20090924
- International Application: PCT/JP2010/065527 WO 20100909
- International Announcement: WO2011/037022 WO 20110331
- Main IPC: G01R31/14
- IPC: G01R31/14

Abstract:
Disclosed are abnormality detecting apparatus and method for a high-voltage circuit (A), in which: a square wave pulse is outputted to a measuring point (p1) with a switch (SW1) set off, the switch (SW1) provided between an inverter circuit (2) and the ground, a difference voltage (Vp-p) between a voltage (Vh) detected at a phase of T/2 and a voltage (V1) detected at a phase of T is obtained, the occurrence of a ground fault is detected based on the size of the difference voltage (Vp-p); and the square wave pulse is outputted to the measuring point (p1) with the switch (SW1) set on, and it is judged that a loosening of a fastening section (p2) occurs when the difference voltage (Vp-p) exceeds a reference voltage (Vref2).
Public/Granted literature
- US20120146656A1 APPARATUS AND METHOD FOR DETECTING ABNORMALITY OF HIGH VOLTAGE CIRCUIT Public/Granted day:2012-06-14
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