Invention Grant
US08749771B1 Apparatus for measuring thickness of lens and method using the apparatus
失效
用于测量透镜厚度的装置和使用该装置的方法
- Patent Title: Apparatus for measuring thickness of lens and method using the apparatus
- Patent Title (中): 用于测量透镜厚度的装置和使用该装置的方法
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Application No.: US13725799Application Date: 2012-12-21
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Publication No.: US08749771B1Publication Date: 2014-06-10
- Inventor: Chang-Wei Kuo
- Applicant: Hon Hai Precision Industry Co., Ltd.
- Applicant Address: TW New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: TW101147942A 20121217
- Main IPC: G01B9/00
- IPC: G01B9/00 ; G03F7/20 ; G01M11/02

Abstract:
An apparatus for measuring a thickness of a lens is disclosed. The apparatus includes a first support, a second support, a third support, a first positioning element, a second element and a measuring element. The lens is disposed on the third support. The first positioning element is fixed to the first support to press against a first face of the lens beforehand. The second positioning element is movably mounted to the second support. The second positioning element can move towards the lens to press against a second face of the lens. The measuring element calculates the thickness of the lens according to the moving distance of the second positioning element.
Public/Granted literature
- US20140168641A1 APPARATUS FOR MEASURING THICKNESS OF LENS AND METHOD USING THE APPARATUS Public/Granted day:2014-06-19
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