Invention Grant
- Patent Title: Robust recognition of clusters of streaks at multiple scales
- Patent Title (中): 在多个尺度上坚固识别条纹簇
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Application No.: US13443441Application Date: 2012-04-10
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Publication No.: US08749843B2Publication Date: 2014-06-10
- Inventor: Juan Liu , Robert Price , Eric S. Hamby
- Applicant: Juan Liu , Robert Price , Eric S. Hamby
- Applicant Address: US CA Palo Alto US CT Norwalk
- Assignee: Palo Alto Research Center Incorporated,Xerox Corporation
- Current Assignee: Palo Alto Research Center Incorporated,Xerox Corporation
- Current Assignee Address: US CA Palo Alto US CT Norwalk
- Agency: Fay Sharpe LLP
- Main IPC: G06K1/00
- IPC: G06K1/00 ; G03G15/00 ; G06K9/00
Abstract:
The present disclosure is generally related to the field of printing, and other processes based on the continuous deposition of material, including industrial molding or extrusion processes, and more particularly to techniques for grouping object quality anomalies in a specified region of an object based on context-specific characterization and shared descriptive profile features.
Public/Granted literature
- US20130265595A1 ROBUST RECOGNITION OF CLUSTERS OF STREAKS AT MULTIPLE SCALES Public/Granted day:2013-10-10
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