Invention Grant
- Patent Title: Anisotropic parameter determination
- Patent Title (中): 各向异性参数测定
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Application No.: US12621972Application Date: 2009-11-19
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Publication No.: US08750074B2Publication Date: 2014-06-10
- Inventor: Emanouil Blias
- Applicant: Emanouil Blias
- Applicant Address: US TX Houston
- Assignee: Baker Hughes Incorporated
- Current Assignee: Baker Hughes Incorporated
- Current Assignee Address: US TX Houston
- Agency: Chowdhury & Georgakis, P.C.
- Main IPC: G01V1/30
- IPC: G01V1/30 ; G01V1/28 ; G01V1/42

Abstract:
A walkaway VSP survey is carried out using a receiver array. First arrivals to a plurality of receivers are picked and used to estimate a normal-moveout (NMO) velocity. Using the NMO velocity and vertical velocities estimated from the VSP data, two anisotropy parameters are estimated for each of the layers. The anisotropy parameters may then be used to process surface seismic data to give a stacked image in true depth and for the interpretation purposes. For multi-azimuthal walkaway or 3D VSP data, we determine two VTI parameters ε and δ for multi-azimuth vertical planes. Then we determine five anisotropic interval parameters that describe P-wave kinematics for orthorhombic layers. These orthorhombic parameters may then be used to process surface seismic data to give a stacked image in true depth and for the interpretation purposes.
Public/Granted literature
- US20100128562A1 Anisotropic Parameter Determination Public/Granted day:2010-05-27
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