Invention Grant
- Patent Title: X-ray imaging system having improved weather resistance
- Patent Title (中): 具有改善耐候性的X射线成像系统
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Application No.: US13248096Application Date: 2011-09-29
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Publication No.: US08750452B2Publication Date: 2014-06-10
- Inventor: Brian Kaval
- Applicant: Brian Kaval
- Applicant Address: US CA Torrance
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Novel IP
- Main IPC: G01N23/04
- IPC: G01N23/04
Abstract:
It is an object of the present application to provide a radiation inspection system, such as an X-ray system, that can operate efficiently even in inclement weather conditions while being highly mobile. Thus the improved inspection system of the present application is capable of operating in high temperature and corrosive environments and is designed to withstand moisture, dirt and/or dust from the articles of inspection as well.
Public/Granted literature
- US20120257718A1 X-RAY IMAGING SYSTEM HAVING IMRPOVED WEATHER RESISTANCE Public/Granted day:2012-10-11
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