Invention Grant
US08750594B2 System and method for non-destructively examining degradation of an interior of a device 有权
用于非破坏性地检查装置内部的劣化的系统和方法

System and method for non-destructively examining degradation of an interior of a device
Abstract:
A system and method for monitoring degradation of a device having a metal layer and a composite layer, such as a vehicle-mounted boom arm. The system can include a collar mounted on an outer surface of the device, a radiography device movably coupled to the collar, and a monitor. The radiography device can include a source of radiography signals positioned to direct radiography signals through at least a portion of the device and a detector to detect radiography signals that have passed through the device. The monitor can be connected to the detector to display an image of the device generated from the detected radiography signals. Anomalies in the device image can represent degradation in the device.
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