Invention Grant
US08750594B2 System and method for non-destructively examining degradation of an interior of a device
有权
用于非破坏性地检查装置内部的劣化的系统和方法
- Patent Title: System and method for non-destructively examining degradation of an interior of a device
- Patent Title (中): 用于非破坏性地检查装置内部的劣化的系统和方法
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Application No.: US13633546Application Date: 2012-10-02
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Publication No.: US08750594B2Publication Date: 2014-06-10
- Inventor: James J. Kovarik , Brent D. Burns , Kevin J. Urness
- Applicant: Florida Power & Light Company
- Applicant Address: US FL Juno Beach
- Assignee: Florida Power and Light Company
- Current Assignee: Florida Power and Light Company
- Current Assignee Address: US FL Juno Beach
- Agency: Feldman Gale, P.A.
- Agent Richard Guerra
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A system and method for monitoring degradation of a device having a metal layer and a composite layer, such as a vehicle-mounted boom arm. The system can include a collar mounted on an outer surface of the device, a radiography device movably coupled to the collar, and a monitor. The radiography device can include a source of radiography signals positioned to direct radiography signals through at least a portion of the device and a detector to detect radiography signals that have passed through the device. The monitor can be connected to the detector to display an image of the device generated from the detected radiography signals. Anomalies in the device image can represent degradation in the device.
Public/Granted literature
- US20130028377A1 System and Method for Non-Destructively Examining Degradation of an Interior of a Device Public/Granted day:2013-01-31
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