Invention Grant
- Patent Title: Automatic generation of run-time instrumenter
- Patent Title (中): 自动生成运行时仪器
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Application No.: US12056063Application Date: 2008-03-26
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Publication No.: US08752007B2Publication Date: 2014-06-10
- Inventor: Juan Jenny Li , David Mandel Weiss
- Applicant: Juan Jenny Li , David Mandel Weiss
- Applicant Address: US NJ Basking Ridge
- Assignee: Avaya Inc.
- Current Assignee: Avaya Inc.
- Current Assignee Address: US NJ Basking Ridge
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F9/45

Abstract:
A method and apparatus for automatically generating a run-time instrumenter are disclosed. In accordance with the illustrative embodiment, an off-line analyzer first determines instrumentation locations for a program under test in accordance with a method called the Super Nested Block Method. After the instrumentation locations have been determined, source code for a run-time instrumenter is automatically generated based on the source code for the program under test and the instrumentation locations. The source code for the program under test and the run-time instrumenter are then compiled into executables, and a testing tool then executes the program under test and the run-time instrumenter in parallel.
Public/Granted literature
- US20090249285A1 Automatic Generation of Run-Time Instrumenter Public/Granted day:2009-10-01
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