Invention Grant
- Patent Title: Analysis apparatus and analysis method
- Patent Title (中): 分析仪器及分析方法
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Application No.: US13217790Application Date: 2011-08-25
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Publication No.: US08758587B2Publication Date: 2014-06-24
- Inventor: Koji Sugiyama , Daisuke Matsumoto , Yasunori Shiraki , Satoshi Yonehara
- Applicant: Koji Sugiyama , Daisuke Matsumoto , Yasunori Shiraki , Satoshi Yonehara
- Applicant Address: JP Kyoto
- Assignee: ARKRAY, Inc.
- Current Assignee: ARKRAY, Inc.
- Current Assignee Address: JP Kyoto
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JP2010-188102 20100825; JP2011-171910 20110805
- Main IPC: G01N27/447
- IPC: G01N27/447 ; G01N27/453 ; G01N30/04 ; G01N30/24

Abstract:
An analysis apparatus is provided with a storage tank, an injection nozzle, a syringe, a collection nozzle, a test sample tank, a microchip having two or more separation channels, detectors, a waste liquid tank, a controller, and a power supply. The collection nozzle collects a specimen which becomes a test sample from a test sample container housing the specimen, and transfers the specimen to the test sample tank. The separation channels separate characteristic components contained in the test sample. The injection nozzle is distanced from the collection nozzle and injects the test sample from the test sample tank into the separation channels. The detectors detect the separated characteristic components in the separation channels.
Public/Granted literature
- US20120048734A1 Analysis Apparatus and Analysis Method Public/Granted day:2012-03-01
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