Invention Grant
- Patent Title: Method for processing samples held by a nanomanipulator
- Patent Title (中): 用于处理由纳米机械手保持的样品的方法
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Application No.: US13567487Application Date: 2012-08-06
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Publication No.: US08759765B2Publication Date: 2014-06-24
- Inventor: Cheryl D. Hartfield , Thomas M. Moore , Brian P. Miller
- Applicant: Cheryl D. Hartfield , Thomas M. Moore , Brian P. Miller
- Applicant Address: US TX Dallas
- Assignee: Omniprobe, Inc.
- Current Assignee: Omniprobe, Inc.
- Current Assignee Address: US TX Dallas
- Agent John A. Thomas
- Main IPC: G01N23/00
- IPC: G01N23/00 ; G21K7/00
Abstract:
A method for processing a sample in a charged-particle beam microscope. A sample is collected from a substrate and the sample is attached to the tip of a nanomanipulator. The sample is optionally oriented to optimize further processing. The nanomanipulator tip is brought into contact with a stabilizing support to minimize drift or vibration of the sample. The attached sample is then stabilized and available for preparation and analysis.
Public/Granted literature
- US20130037713A1 METHOD FOR PROCESSING SAMPLES HELD BY A NANOMANIPULATOR Public/Granted day:2013-02-14
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