The present disclosure generally relates to an evanescent microwave microscopy probe and methods for making and using the same. Some embodiments relate to a probe which is constructed of silver. Other embodiments relate to a method of measuring an unknown property a target material, comprising moving the probe away from the target material, taking a first measurement, moving the probe such that it touches the target material, taking a second measurement, and comparing the first and second measurements in order to measure the unknown property.