Invention Grant
- Patent Title: Test head docking system and method with sliding linkage
- Patent Title (中): 测试头对接系统和滑动联动方法
-
Application No.: US13003660Application Date: 2009-07-10
-
Publication No.: US08760182B2Publication Date: 2014-06-24
- Inventor: James B. Wood , Bryan M. Porch
- Applicant: James B. Wood , Bryan M. Porch
- Applicant Address: US NJ Mt. Laurel
- Assignee: inTEST Corporation
- Current Assignee: inTEST Corporation
- Current Assignee Address: US NJ Mt. Laurel
- Agency: RatnerPrestia
- International Application: PCT/US2009/050236 WO 20090710
- International Announcement: WO2010/009013 WO 20100121
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/20
Abstract:
A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system includes a power driven actuator for powered bringing together of the electronic test head and the handling apparatus.
Public/Granted literature
- US20110305501A1 TEST HEAD DOCKING SYSTEM AND METHOD Public/Granted day:2011-12-15
Information query
