Invention Grant
- Patent Title: Low capacitance probe for testing circuit assembly
- Patent Title (中): 用于测试电路组件的低电容探头
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Application No.: US12645424Application Date: 2009-12-22
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Publication No.: US08760185B2Publication Date: 2014-06-24
- Inventor: Anthony J. Suto
- Applicant: Anthony J. Suto
- Agency: Wolf, Greenfield & Sacks, P.C.
- Main IPC: G01R31/312
- IPC: G01R31/312

Abstract:
An improved system for capacitive testing electrical connections in a low signal environment. The system includes features that increase sensitivity of a capacitive probe. One feature is a spacer positioned to allow the probe to be partially inserted into the component without contacting the pins. The spacer may be a collar on the probe that contacts the housing of the component, contacts the substrate of the circuit assembly, or both. In some other embodiments, the spacer may be a riser extending beyond the surface of the sense plate that contacts the component, a riser portion of the component, or a combination of both. The spacer improves sensitivity by establishing a small gap between a sense plate of the probe and pins under test without risk of damage to the pins. A second feature is a guard plate of the probe with reduced capacitance to a sense plate of the probe. Reducing capacitance also increases the sensitivity of the probe.
Public/Granted literature
- US20110148450A1 LOW CAPACITANCE PROBE FOR TESTING CIRCUIT ASSEMBLY Public/Granted day:2011-06-23
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