Invention Grant
- Patent Title: High aspect ratio openings
- Patent Title (中): 高纵横比开口
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Application No.: US13616642Application Date: 2012-09-14
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Publication No.: US08760841B2Publication Date: 2014-06-24
- Inventor: Mark W. Kiehlbauch
- Applicant: Mark W. Kiehlbauch
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: H01G4/002
- IPC: H01G4/002

Abstract:
A capacitor forming method includes forming an electrically conductive support material over a substrate, with the support material containing at least 25 at % carbon. The method includes forming an opening through at least the support material where the opening has an aspect ratio of at least 20:1 within a thickness of the support material. After forming the opening, the method includes processing the support material to effect a reduction in conductivity, and forming a capacitor structure in the opening.
Public/Granted literature
- US20130008000A1 HIGH ASPECT RATIO OPENINGS Public/Granted day:2013-01-10
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