Invention Grant
- Patent Title: Memory sensing using temperature compensated initial currents
- Patent Title (中): 使用温度补偿初始电流的存储器感测
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Application No.: US13221071Application Date: 2011-08-30
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Publication No.: US08760939B2Publication Date: 2014-06-24
- Inventor: Jennifer E. Taylor , John D. Porter
- Applicant: Jennifer E. Taylor , John D. Porter
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G11C5/14
- IPC: G11C5/14

Abstract:
The present disclosure includes devices, methods, and systems for sensing memory, such as resistance variable memory, among other types of memory. One or more embodiments can include a method for generating currents to be used in sensing a memory cell, the method including providing a number of initial currents, and generating a number of reference currents by summing particular combinations of the initial currents.
Public/Granted literature
- US20110310661A1 MEMORY SENSING DEVICES, METHODS, AND SYSTEMS Public/Granted day:2011-12-22
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