Invention Grant
- Patent Title: Determining a quantity of a given material in a subterranean structure
- Patent Title (中): 确定地下结构中给定材料的数量
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Application No.: US13118162Application Date: 2011-05-27
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Publication No.: US08760968B2Publication Date: 2014-06-24
- Inventor: Jianchun Dai
- Applicant: Jianchun Dai
- Applicant Address: US TX Houston
- Assignee: WesternGeco L.L.C.
- Current Assignee: WesternGeco L.L.C.
- Current Assignee Address: US TX Houston
- Main IPC: G01V1/00
- IPC: G01V1/00 ; G01V1/28
Abstract:
A profile is produced based on measured survey data, where the profile contains indications corresponding to refraction events at different depths in a subterranean structure. Based on the profile and a critical angle model that correlates different concentrations of a given material to respective critical angles, a quantity of the given material in a subterranean structure at a particular depth is determined.
Public/Granted literature
- US20110292767A1 DETERMINING A QUANTITY OF A GIVEN MATERIAL IN A SUBTERRANEAN STRUCTURE Public/Granted day:2011-12-01
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