Invention Grant
- Patent Title: Semiconductor device, method for testing same and transmitting circuit
- Patent Title (中): 半导体器件,测试方法和发射电路
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Application No.: US13424338Application Date: 2012-03-19
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Publication No.: US08761599B2Publication Date: 2014-06-24
- Inventor: Toyoaki Uo
- Applicant: Toyoaki Uo
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Patterson & Sheridan, LLP
- Priority: JP2011-176801 20110812
- Main IPC: H04B17/00
- IPC: H04B17/00

Abstract:
According to an embodiment, a semiconductor device includes an analog/digital conversion unit, a pulse width modulation unit outputting a transmission signal, the transmission signal being a pulse pattern corresponding to a digital signal output from the analog/digital conversion unit, a reference signal generation unit generating a reference signal, the reference signal being a fixed pulse pattern. The device includes a first control unit selecting one of the transmission signal and the reference signal, a light emitting element drive unit outputting a drive current based on the transmission signal or the reference signal, a light emitting element driven by the light emitting element drive unit. The device includes an optical receiving unit converting the optical signal into a voltage signal, and a demodulation unit demodulating the voltage signal into a digital signal based on the transmission signal or the reference signal.
Public/Granted literature
- US20130039648A1 SEMICONDUCTOR DEVICE, METHOD FOR TESTING SAME AND TRANSMITTING CIRCUIT Public/Granted day:2013-02-14
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