Invention Grant
- Patent Title: Supporting detection of failure event
- Patent Title (中): 支持检测故障事件
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Application No.: US13796196Application Date: 2013-03-12
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Publication No.: US08762777B2Publication Date: 2014-06-24
- Inventor: Yasuhisa Gotoh , Yuhsuke Kaneyasu
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Stephen R. Tkacs; Stephen J. Walder, Jr.; Jeffrey S. LaBaw
- Priority: JP2008-279289 20081030
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
In a mechanism for supporting detection of a failure event, history information of a system including log information of the system including plural components and/or failure information output from each component upon occurrence of a failure in the system is collected. A detection rule for detecting an event included in a component related to the failure that has occurred is generated, and a symptom with additional information added to the generated detection rule is applied to detect the event that has caused the failure. System configuration information as configuration information of the system is acquired, and from the acquired system configuration information, partial configuration information as system configuration information related to the component that sent out the event the selection of which has been accepted is extracted. The extracted partial configuration information is added to the symptom to update the symptom.
Public/Granted literature
- US20130191694A1 Supporting Detection of Failure Event Public/Granted day:2013-07-25
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