Invention Grant
US08763453B2 Arrangement for measuring fill level with a fill level measuring device working with microwaves
有权
用与微波一起工作的填充水平测量装置测量填充水平的布置
- Patent Title: Arrangement for measuring fill level with a fill level measuring device working with microwaves
- Patent Title (中): 用与微波一起工作的填充水平测量装置测量填充水平的布置
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Application No.: US13320852Application Date: 2010-04-23
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Publication No.: US08763453B2Publication Date: 2014-07-01
- Inventor: Ralf Reimelt
- Applicant: Ralf Reimelt
- Applicant Address: DE Maulburg
- Assignee: Endress + Hauser GmbH + Co. KG
- Current Assignee: Endress + Hauser GmbH + Co. KG
- Current Assignee Address: DE Maulburg
- Agency: Bacon & Thomas, PLLC
- Priority: DE102009026433 20090525
- International Application: PCT/EP2010/055442 WO 20100423
- International Announcement: WO2010/136276 WO 20101202
- Main IPC: G01F23/00
- IPC: G01F23/00 ; H01P1/08

Abstract:
An arrangement for measuring fill level of a fill substance in a container, comprising: a fill level measuring device, wherein the device includes measuring device electronics and an antenna connected to the measuring device electronics; and at least one feedthrough installed in a signal path of the microwave signals or the reflection signals; the feedthrough. The feedthrough comprises a hollow conductor, into which a microwave transparent window is inserted gas tightly. The window comprises: a disk, whose thickness corresponds approximately to a half wavelength or a small integer multiple of the half wavelength of a first, hollow conductor propagation capable, signal mode of the microwave signals at a predetermined signal frequency in the disk; and two matching layers located on oppositely lying, outer surfaces of the disk. The thickness of each matching layer corresponds approximately to a fourth of the wavelength of the first, hollow conductor propagation capable, signal mode of the microwave signals at the predetermined signal frequency in the matching layers.
Public/Granted literature
- US20120060600A1 ARRANGEMENT FOR MEASURING FILL LEVEL WITH A FILL LEVEL MEASURING DEVICE WORKING WITH MICROWAVES Public/Granted day:2012-03-15
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