Invention Grant
US08763453B2 Arrangement for measuring fill level with a fill level measuring device working with microwaves 有权
用与微波一起工作的填充水平测量装置测量填充水平的布置

  • Patent Title: Arrangement for measuring fill level with a fill level measuring device working with microwaves
  • Patent Title (中): 用与微波一起工作的填充水平测量装置测量填充水平的布置
  • Application No.: US13320852
    Application Date: 2010-04-23
  • Publication No.: US08763453B2
    Publication Date: 2014-07-01
  • Inventor: Ralf Reimelt
  • Applicant: Ralf Reimelt
  • Applicant Address: DE Maulburg
  • Assignee: Endress + Hauser GmbH + Co. KG
  • Current Assignee: Endress + Hauser GmbH + Co. KG
  • Current Assignee Address: DE Maulburg
  • Agency: Bacon & Thomas, PLLC
  • Priority: DE102009026433 20090525
  • International Application: PCT/EP2010/055442 WO 20100423
  • International Announcement: WO2010/136276 WO 20101202
  • Main IPC: G01F23/00
  • IPC: G01F23/00 H01P1/08
Arrangement for measuring fill level with a fill level measuring device working with microwaves
Abstract:
An arrangement for measuring fill level of a fill substance in a container, comprising: a fill level measuring device, wherein the device includes measuring device electronics and an antenna connected to the measuring device electronics; and at least one feedthrough installed in a signal path of the microwave signals or the reflection signals; the feedthrough. The feedthrough comprises a hollow conductor, into which a microwave transparent window is inserted gas tightly. The window comprises: a disk, whose thickness corresponds approximately to a half wavelength or a small integer multiple of the half wavelength of a first, hollow conductor propagation capable, signal mode of the microwave signals at a predetermined signal frequency in the disk; and two matching layers located on oppositely lying, outer surfaces of the disk. The thickness of each matching layer corresponds approximately to a fourth of the wavelength of the first, hollow conductor propagation capable, signal mode of the microwave signals at the predetermined signal frequency in the matching layers.
Information query
Patent Agency Ranking
0/0