Invention Grant
- Patent Title: Dew formation testing device and dew formation testing method
- Patent Title (中): 露点测试装置和露点测试方法
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Application No.: US13266475Application Date: 2010-04-05
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Publication No.: US08763480B2Publication Date: 2014-07-01
- Inventor: Tetsuya Shimada , Hirokazu Tanaka , Akira Okamoto , Yoshinori Mizuma , Seiichi Okada
- Applicant: Tetsuya Shimada , Hirokazu Tanaka , Akira Okamoto , Yoshinori Mizuma , Seiichi Okada
- Applicant Address: JP JP
- Assignee: Espec Corp.,Murata Manufacturing Co., Ltd.
- Current Assignee: Espec Corp.,Murata Manufacturing Co., Ltd.
- Current Assignee Address: JP JP
- Agent Gerald E. Hespos; Michael J. Porco; Matthew T. Hespos
- Priority: JP2009-109839 20090428
- International Application: PCT/JP2010/002495 WO 20100405
- International Announcement: WO2010/125748 WO 20101104
- Main IPC: G01N25/68
- IPC: G01N25/68 ; G01N17/00

Abstract:
A dew formation testing device has an adjustment tank capable of adjusting the temperature and humidity of air to predetermined temperature and humidity, a testing tank installed separately from the adjustment tank and having a sample base that has a mounting surface, onto which a testing sample W can be placed, and that is capable to cool the mounting surface, and ducts that link the adjustment unit and the testing tank. The testing tank is provided with an air guide member that, when air flowing into the testing tank through the duct flows onto the sample base from a side of the sample base, guides the air in the direction tilted downward at a predetermined angle, the guidance being performed at a position right above the sample base at an end thereof which is on the upstream side of the air flow.
Public/Granted literature
- US20120055273A1 DEW FORMATION TESTING DEVICE AND DEW FORMATION TESTING METHOD Public/Granted day:2012-03-08
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