Invention Grant
- Patent Title: Semiconductor device and manufacturing method therefor
- Patent Title (中): 半导体装置及其制造方法
-
Application No.: US13516889Application Date: 2011-07-26
-
Publication No.: US08765584B2Publication Date: 2014-07-01
- Inventor: Yoshitaka Kadowaki , Tatsunori Toyota
- Applicant: Yoshitaka Kadowaki , Tatsunori Toyota
- Applicant Address: JP Tokyo
- Assignee: Dowa Electronics Materials Co., Ltd.
- Current Assignee: Dowa Electronics Materials Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2010-172283 20100730
- International Application: PCT/JP2011/004209 WO 20110726
- International Announcement: WO2012/014448 WO 20120202
- Main IPC: H01L21/28
- IPC: H01L21/28 ; H01L21/44

Abstract:
A semiconductor device and a manufacturing method therefor, wherein, during lift-off, no cracks due to internal stresses occur in the compound semiconductor layer. A method for manufacturing a semiconductor device having a structure in which a semiconductor layer is bonded on a supporting substrate, including: a device region formation step of forming a device region including the semiconductor layer on a growth substrate through a lift-off layer; a columnar member formation step of forming a columnar member on the growth substrate; a bonding step of bonding the tops of the semiconductor layer and the columnar member to a supporting substrate; a lift-off step of separating the bottom face of the semiconductor layer from the growth substrate by removing the lift-off layer, and not separating the columnar member from the growth substrate; and a step of separating the columnar member from the supporting substrate.
Public/Granted literature
- US20120256327A1 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR Public/Granted day:2012-10-11
Information query
IPC分类: