Invention Grant
- Patent Title: Control imaging methods in advanced ultrafast electron microscopy
- Patent Title (中): 先进的超快速电子显微镜控制成像方法
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Application No.: US13893054Application Date: 2013-05-13
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Publication No.: US08766181B2Publication Date: 2014-07-01
- Inventor: Ahmed H. Zewail , John Spencer Baskin
- Applicant: California Institute of Technology
- Applicant Address: US CA Pasadena
- Assignee: California Institute of Technology
- Current Assignee: California Institute of Technology
- Current Assignee Address: US CA Pasadena
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: H01J37/26
- IPC: H01J37/26 ; H01J37/22 ; G01N23/00
Abstract:
An optical system includes a beam splitter disposed along an optical axis and a set of mirrors optically coupled to the beam splitter. The set of mirrors are oriented perpendicular to each other. The optical system also includes a turning mirror optically coupled to a second mirror of the set of mirrors and a detector optically coupled to the turning mirror.
Public/Granted literature
- US20140131574A1 CONTROL IMAGING METHODS IN ADVANCED ULTRAFAST ELECTRON MICROSCOPY Public/Granted day:2014-05-15
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