Invention Grant
- Patent Title: Scanning electron microscope
- Patent Title (中): 扫描电子显微镜
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Application No.: US13994811Application Date: 2011-11-02
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Publication No.: US08766184B2Publication Date: 2014-07-01
- Inventor: Haruhiko Hatano , Hiroyuki Suzuki , Yoshihiko Nakayama
- Applicant: Haruhiko Hatano , Hiroyuki Suzuki , Yoshihiko Nakayama
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2011-005392 20110114
- International Application: PCT/JP2011/006130 WO 20111102
- International Announcement: WO2012/095911 WO 20120719
- Main IPC: H01J37/21
- IPC: H01J37/21 ; H01J37/20

Abstract:
With a scanning electron microscope (SEM) adopting a commonly available exhaust system such as a turbo-molecular pump, an ion pump, or a rotary pump, and so forth, there is realized an apparatus capable of safely executing observation, or adsorption of a target substance that is high in rarity. Further, there is realized a safe SEM low in the risk of an electrical discharge by providing the apparatus with a probe, a means for replacing an atmosphere in a specimen chamber, with a predetermined gas, and a means for forming an image by detection of an ion current, and detection of an absorption current. Further, there is provided a means for controlling the polarity of a voltage applied to the probe. Still further, there is provided a control means for controlling a value of the voltage applied to the probe according to a degree of vacuum.
Public/Granted literature
- US20130284923A1 SCANNING ELECTRON MICROSCOPE Public/Granted day:2013-10-31
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