Invention Grant
- Patent Title: Radiation detection element
- Patent Title (中): 辐射检测元件
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Application No.: US13513799Application Date: 2010-05-06
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Publication No.: US08766197B2Publication Date: 2014-07-01
- Inventor: Hidehito Nakamura
- Applicant: Hidehito Nakamura
- Applicant Address: JP Chiba-shi
- Assignee: National Institute of Radiological Sciences
- Current Assignee: National Institute of Radiological Sciences
- Current Assignee Address: JP Chiba-shi
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: WOPCT/JP2009/070380 20091204
- International Application: PCT/JP2010/057753 WO 20100506
- International Announcement: WO2011/067952 WO 20110609
- Main IPC: G01T1/20
- IPC: G01T1/20 ; C09K11/06
Abstract:
Disclosed is a radiation detection element which can inexpensively be manufactured. The detection element including, as a main component, a base resin not containing any fluorescent substance at all is used for radiation measurement.
Public/Granted literature
- US20120235046A1 RADIATION DETECTION ELEMENT Public/Granted day:2012-09-20
Information query
