Invention Grant
US08766199B2 Radiation dose based imaging detector tile parameter compensation
有权
基于辐射剂量的成像检测器瓦片参数补偿
- Patent Title: Radiation dose based imaging detector tile parameter compensation
- Patent Title (中): 基于辐射剂量的成像检测器瓦片参数补偿
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Application No.: US13510168Application Date: 2010-11-18
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Publication No.: US08766199B2Publication Date: 2014-07-01
- Inventor: Marc A. Chappo , Randall P. Luhta , Rodney A. Mattson
- Applicant: Marc A. Chappo , Randall P. Luhta , Rodney A. Mattson
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- International Application: PCT/IB2010/055267 WO 20101118
- International Announcement: WO2011/073819 WO 20110623
- Main IPC: G01T1/02
- IPC: G01T1/02 ; G01T7/00
Abstract:
A detector tile (116) of an imaging system (100) includes a photosensor array (204) and electronics (208) electrically coupled to the photosensor array (204), wherein the electronics includes a dose determiner (402) that determines a deposited dose for the detector tile (116) and generates a signal indicative thereof. In one non-limiting instance, this signal is utilized to correct parameters such as gain and thermal coefficients, which may vary with radiation dose.
Public/Granted literature
- US20120313000A1 RADIATION DOSE BASED IMAGING DETECTOR TILE PARAMETER COMPENSATION Public/Granted day:2012-12-13
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